Atomic Force Microscopy

Bruker Dimension Fastscan-Icon

Technical specifications:

Scanning probe microscope, which operates in several modes: Contact; Intermittent contact; Phase; Non-contact; Lateral strength; PeakForce, Nanomechanical Mapping; Lift Mode, Force Volume, MFM (Magnetic Force Microscopy), EFM (Electrostatic Force Microscopy), Force Spectroscopy and Piezo-response. The interaction of the probe with a surface allows mapping some properties of the sample, such as: topography, adhesion, elasticity, magnetic and electrical properties.

Management Committee

Marcia Attias
Lattes
Wanderley de Souza
Lattes

Responsible technologists:

Vacante
Lattes
Vacante
Lattes

Need more information? Contact us: microscopia.cenabio@gmail.com

Meet UMA
Team UMA
UMA Platforms
Contact and Location