Bruker Dimension Fastscan-Icon
Technical specifications:
Scanning probe microscope, which operates in several modes: Contact; Intermittent contact; Phase; Non-contact; Lateral strength; PeakForce, Nanomechanical Mapping; Lift Mode, Force Volume, MFM (Magnetic Force Microscopy), EFM (Electrostatic Force Microscopy), Force Spectroscopy and Piezo-response. The interaction of the probe with a surface allows mapping some properties of the sample, such as: topography, adhesion, elasticity, magnetic and electrical properties.
Contact: microscopia.cenabio@gmail.com
