JEOL 1200 EX
Technical specifications:
Transmission electron microscope with a tungsten electron source, it operates from 80 kV up to 120 kV, and image acquisition modes are TEM (Transmission Electron Microscopy) and STEM (Scanning Transmission Electron Microscopy). It is also equipped for Cryo-microscopy and has an EDS (energy dispersive spectrocopy) detector for X-ray microanalysis. It has a 1k Megaview G2 CCD camera.
FEI Tecnai G20 FEG
Technical specifications:
High resolution transmission electron microscope, with 200 kV electron accelerating voltage. Equipped with a field emission gun electron source (FEG), reaching a resolution power of 1.44 Å, and a 4K AMT CMOS camera. It has an optimized goniometer and specialized software that automatically collects images through a series of inclinations (Tomography), and operation mode in scanning-transmission (STEM), with high angle annular dark field detector (HAADF). It has sample holders for generating images at cryogenic temperatures (cryoholder) for performing cryotransmission electron microscopy (cryoTEM) and cryoscanning transmission electron microscopy (cryoSTEM), and tomography at cryogenic temperatures in cryoTEM and cryoSTEM modes.
FEI Tecnai Spirit Bio-Twin
Technical specifications:
Transmission electron microscope, with variable electron acceleration voltage between 80 and 120 kV. Equipped with a thermionic electron source and a Lanthanum Hexaboride (LaB6) filament, reaching a resolution power of 2.4 Å, and a 2K Veleta Olympus CCD camera. It has an optimized goniometer and specialized software that automatically collects images through a series of inclinations (Tomography), and an iCorr module for analyzes by correlative microscopy (Fluorescence/Transmission).
FEI Tecnai T20
Technical specifications:
Transmission electron microscope, which operates at an accelerating voltage of 200 kV. It has a lanthanum hexaboride (LaB6) electron source. It is equipped with a Gatan 4K CMOS camera, which allows acquisition of images by transmission mode (TEM – Transmission Electron Microscopy) and, with a high angle annular dark field detector (HAADF), for acquisition of images in STEM mode (Scanning Transmission Electron Microscopy). It is optimized for cryomicroscopy, enabling the use for both transmission (CryoTEM) and scanning transmission (CryoSTEM) modes. It has a goniometer and a software for the acquisition of electronic tomography in TEM, STEM, CryoTEM and CryoSTEM modes. It is equipped with Selected Area Aperture (SAD) for electron diffraction.
HITACHI HT 7800
Technical specifications:
Transmission electron microscope, which operates at an acceleration voltage between 80 kV and 120 kV. It has a lanthanum hexaboride (LaB6) electron source. It is equipped with an AMT 8K CMOS camera, which allows high contrast transmission mode (TEM – Transmission Electron Microscopy) image acquisition. It has a goniometer and a software for acquiring electron tomography in transmission mode.
ZEISS EM 900
Technical specifications:
Transmission electron microscope with a tungsten electron source, operates at 80 kV for routine analysis in TEM mode. It is equipped with a 1k Megaview CCD camera.
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